Memfault: NXP & Memfault: Higher Quality, Better Performing IoT Devices with Embedded Observability

NXP and Memfault are collaborating to give IoT device manufacturers in-field device monitoring, crash reporting, and updating capabilities for faster product development, improved device operation, and reduced direct resource costs.

Together, Memfault and NXP will help IoT developers building smart city, smart home, IIoT, and automotive devices save time and ease the worry of triaging and troubleshooting, allowing them to focus on building value-added features.

Join this free webinar on June 28 to learn how to:

• Gain deep insights into embedded device performance in a cloud-based environment
• Access debugging information without requiring any user interaction, device RMAs, or on-site visits
• Orchestrate complex OTA updates of firmware in an organized and controlled manner
• Get started with a project example using Memfault and NXP i.MX RT1060 MCUs