Operations | Monitoring | ITSM | DevOps | Cloud

June 2022

NXP & Memfault: Higher Quality, Better Performing IoT Devices with Embedded Observability Webinar

NXP and Memfault have collaborated to give IoT device manufacturers in-field device monitoring, crash reporting, and updating capabilities for faster product development, improved device operation, and reduced direct resource costs. Together, Memfault and NXP are helping IoT developers build smart cities, smart homes, IIoT, and automotive devices to save time and ease the worry of triaging and troubleshooting, allowing them to focus on building value-added features.

Launching an IoT Device: A Blueprint to Success

About the webinar: Executives and customers expect IoT devices to be delivered on time. And once they are shipped, they expect the devices to work well, last for a long time, and get regular updates that deliver new and unique features. How can product teams meet their deadlines and the growing demands of their customers? In this recorded webinar, Memfault CEO François Baldassari discusses how you can ship your devices on time (or even earlier) without sacrificing quality.

Building an On-Device Embedded Testing Library

There are too few C/C++ testing libraries designed for embedded devices. The traditional libraries are not designed for constrained resources and rely on host functionality like a filesystem or standard output. In this post, I detail why I’ve decided to design a new testing library for microcontrollers and cover the rationale, design choices, and thoughts on the prototype. Like Interrupt? Subscribe to get our latest posts straight to your mailbox.