Operations | Monitoring | ITSM | DevOps | Cloud

March 2024

Diving into JTAG - BSDL (Part 4)

In the previous article of this series, we briefly touched on how.bsd files written in Boundary Scan Description Language (BSDL) describe the structure of the boundary scan chain and the instruction set. In this article, we will examine this language’s syntax more closely before seeing how.bsd files are leveraged in JTAG testing in the next article.

Diving into JTAG - Debugging (Part 3)

In the third installment of this JTAG deep dive series, we will talk in-depth about JTAG Boundary-Scan, a method used to test interconnects on PCBs and internal IC sub-blocks. It is defined in the IEEE 1149.1 standard. I recommend reading Part 1 & Part 2 of the series to get a good background on debugging with JTAG before jumping into this one!

Differences Between ELF-32 and ELF-64

Have you ever wondered if ELF is portable between 32-bit and 64-bit targets? Probably not, but this might be a common scenario for you if you work on 32-bit embedded devices but use a 64-bit host. Or maybe you’ve developed tooling for 32-bit MCUs and are transitioning to working on 64-bit targets. The ELF object file format is one of the most commonly used today. Most build systems provide an output to this format, and ELF is commonly used to output coredumps.

Introducing Device Vitals

Memfault would like to introduce you to Device Vitals. To ensure that your product maintains its quality even after it is launched, it is crucial to monitor three key indicators for your devices in the field: stability, connectivity, and battery life. By collecting Device Vitals, you can have access to valuable data that helps you understand the overall health of your fleet and the quality of your product.

How to get Memfault Device Vitals up and running on an MCU (ESP32) - Integration Walkthrough

In this video Memfault Field CTO Thomas will walk you through each step to get your MCU based device integrated on Memfault and reporting crash data and our newly released, Device Vitals into Memfault. This walk through is using an ESP32 based device but the same principles can be applied to any MCU and we have lots of guidance available for different chipsets in our technical documentation.

Measure Embedded Device Quality in the Field with Ease

François Baldassari reveals our biggest product release yet. This pivotal launch marks a new era in IoT device performance monitoring, ensuring unparalleled insights into software stability, battery health, and connectivity— the three critical aspects of device vitality. Our latest breakthrough allows for the precise evaluation of your devices' quality, enabling swift identification and resolution of any issues. With François leading the charge, explore how our newest innovation empowers you to.

Beyond the Launch: Enhancing IoT Device Quality

Product quality doesn’t stop when your devices are deployed. In fact, that’s when it matters most. And yet even with rigorous testing, all bets are off once your product hits the field. It’s impossible to anticipate every variable and environment your devices will encounter. So how can you make sure your customers continue to love your product—not only on day 1, but 6 months down the road? Find out exactly how to get the data you need to guide your team’s development decisions and deliver products that perform in the real world.